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dc.contributor.authorRahman, Mostafijur
dc.contributor.authorOthman, Rozmie Razif
dc.contributor.authorAhmad, R Badlishah
dc.contributor.authorRahman, Md. Mijanur
dc.date.accessioned2018-09-25T03:43:38Z
dc.date.available2018-09-25T03:43:38Z
dc.date.issued2014
dc.identifier.urihttp://hdl.handle.net/20.500.11948/3304
dc.description.abstractExhaustive testing for event driven sequence input interaction is costly and not always practicable for all types of software testing. So, an alternative technique is crucial where optimum/near optimum test case generation is key concern. This paper presents a feasible test suite generation technique using a meta heuristic search called Simulated Annealing (SA) for T-way Event Driven Input Sequence Test Case (EDISTC) Generator and abbreviated as T-way EDISTC-SA generator. The T-way EDISTC-SA technique focuses on a heuristic analysis for generating feasible and near optimum test suite(s), where a cost function carefully initiates acceptable test input sequences and a fine-tuned cooling rate with temperature takes part as an iterative perspective. We corroborate on EDISTC-SA algorithm by doing a number of experiments to achieve optimum and/or near optimum test cases from a number of test input sequences. The experimental results are tested on a real application called Embedded Network Traffic Monitoring System (ENTM). Analysis on EDISTC-SA strategy shows that the optimum test suite is found from some of the iterated solution and there is possibility to have more feasible accepted test suites. Full Text Link: http://doi.org/10.5013/IJSSST.a.15.03.10en_US
dc.language.isoenen_US
dc.publisherUnited Kingdom Simulation Societyen_US
dc.subjectEvent Driven Sequence Testingen_US
dc.subjectFeasible Test Suiteen_US
dc.subjectSimulated Annealingen_US
dc.subjectT-way Sequence Covering Treeen_US
dc.subjectSoftware Planningen_US
dc.titleA Meta Heuristic Search based T-way Event Driven Input Sequence Test Case Generatoren_US
dc.typeArticleen_US


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